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Thanks to Fluoracle’s signal monitoring and easy switching between measurement modes, you can characterise the spectrum, lifetime, and quantum yield of a sample in just a few minutes. See Fluoracle in action in this virtual FS5 demo:
Temperature-dependent PL emission spectra from NaY0.77Yb0.20Er0.03F4. Fluoracle controls the temperature stage so that maps are automatically acquired.
Time-resolved electroluminescence decay of a white light InGaN LED acquired with TCSPC: time-resolved emission spectrum (left) and exponential fit result at 575 nm.
Multichannel scaling (MCS) decay of CzDBA and biexponential fit result. tp = prompt fluorescence lifetime, td = delayed fluorescence lifetime.
Quantum yield measurement from upconversion nanoparticles (UCNPs). The calculated upconversion quantum yield result is 0.014%.
Time-resolved fluorescence anisotropy for a dye in glycerol at different temperatures. Instrument response function plotted in grey.
Photoluminescence spectrum and corresponding CIE 1931 chromaticity plot of α-(DMEN)PbBr4 calculated using Fluoracle.
Photoluminescence intensity map of a halide perovskite surface acquired with FluoracleMap software (included with MicroPL accessory).
| Software Functionality for Steady State Spectroscopy | ||
|---|---|---|
| Measurement Modes | Control Features | Data Manipulation and Display |
| Signal rates | Wavelength selection (λEX & λEM) | Arithmetic ( + , - , × , / , append ) |
| Excitation spectra | Grating selection | Scaling / multiplication factor |
| Emission spectra | Spectral bandwidths | Normalise |
| Anisotropy spectra | Integration time per data point (1 ms – 200 s) | Baseline subtraction |
| Kinetic measurements | Sample selection (multi-position sample wells) | Crop range |
| Synchronous spectra | Programmed excitation shutter | Smooth |
| Corrected spectra | Programmed attenuator | 2D, 3D, Contour and text |
| Temperature resolved spectra map | Source and detector selection | Grid ON / OFF |
| Synchronous spectra map | Online spectral data correction | Differentiation / Integration |
| Excitation-emission map | Post acquisition spectral correction | Peak search |
| Sample temperature monitoring | Polariser selection and orientation | Correction |
| Reflection measurements | X-Y Sample stage control | Anisotropy (G factor corrected) |
| Absorption measurements | Sample temperature control | Logarithmic / linear scales |
| Absorptance | Sample selection (multiple cuvette holders) | Comprehensive measurement and file properties for record keeping |
| Reflectance | Temperature control of sample holders | Data manipulation and ASCII / CSV output |
| Batch measurements | Detector gating for phosphorescence spectra | Cursor locations |
| Absolute quantum yield measurements | Cryostat control | Join, split and extract frames |
| Multiple sample position and well-plate measurements | Microscope stage control | Spectral correction wizard |
| Service scans | Plate reader control | Absolute quantum yield wizard |
| Titrator control | Chromaticity calculation and display wizard | |
| Software Functionality for Time-Resolved Photoluminescence Measurements | ||
|---|---|---|
| Measurement modes | Control Features | Analysis Features |
| Signal rates | Wavelength selection for excitation and emission monochromators | Full data reconvolution using a non-linear least square fitting routine: |
| Manual lifetime measurement | Sample selection (multi-position sample holders) | Exponential reconvolution or simple tail fit |
| Multiple lifetime measurement | Detector selection (up to 3) | 1-4 independent exponential decay times, fixed or as free fit parameters |
| Instrument Response Measurement | nF920 flashlamp voltage, frequency control and gas pressure monitor | Shift parameters, fixed or as a free fit parameter |
| Time resolved excitation spectra | External Laser Triggering | Background fit, fixed or as a free fit parameter |
| Time resolved emission spectra | Programmable iris attenuator | Chi-squared goodness-of-fit test |
| Fluorescence anisotropy | Multiple sources | Weighted residuals, Durbin-Watson parameter |
| Temperature controlled lifetime measurements | Polariser selection and orientation | Autocorrelation function |
| Sample temperature monitoring | Cryostat control | Anisotropy calculation |
| Multiple sample position and well-plate measurements | Measurement to peak counts or preset time | Time resolved spectra |
| Forward or Reverse mode | ||
| CFD settings on START and STOP: threshold, zero crossing and divider | ||
| Channel Selection: 512 - 8192 channels (TCSPC) and 500 - 8000 channels (MCS) | ||
| Time Range Selection: 2.5 ns - 50 µs (TCSPC) and 5 ms - 1000 s (MCS) | ||